Proton Irradiation Effects on the Time-Dependent Dielectric Breakdown Characteristics of Normally-Off AlGaN/GaN Gate-Recessed Metal-Insulator-Semiconductor Heterostructure Field Effect Transistors
Keum, Dongmin, Kim, HyungtakVolume:
10
Language:
english
Journal:
Micromachines
DOI:
10.3390/mi10110723
Date:
October, 2019
File:
PDF, 2.83 MB
english, 2019