[AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twentieth International Conference - Fort Worth (Texas) (10–15 August 2008)] AIP Conference Proceedings - Defect Density Mapping of Shot Peened Materials Using Positron Annihilation Spectroscopy
Gagliardi, Marcus A., Hunt, Alan W., McDaniel, Floyd D., Doyle, Barney L.Year:
2009
DOI:
10.1063/1.3120174
File:
PDF, 1.50 MB
2009