Double-side pixelated X-ray detector based on metamorphic...

Journal of Instrumentation 2019 / 01 Vol. 14; Iss. 1

Double-side pixelated X-ray detector based on metamorphic InGaAs/InAlAs quantum well

Ganbold, T., Antonelli, M., Biasiol, G., Nichetti, C., Cautero, G., Menk, R.H.
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Volume:
14
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/14/01/C01014
Date:
January, 2019
File:
PDF, 1.78 MB
2019
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