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Spectroscopic and morphological studies of SiO2 graded index thin films fabricated at oblique incidence angles
Vemuri, SRS Praveen Kumar, Kumar, Mukesh, Kumari, Neelam, Sharma, Amit L.Language:
english
Journal:
Optical Materials
DOI:
10.1016/j.optmat.2019.109560
Date:
November, 2019
File:
PDF, 2.31 MB
english, 2019