Preparing TEM Specimens and Atom Probe Tips by Laser Machining
Rottwinkel, Boris, Kreutzer, André, Spott, Henry, Krause, Michael, Schusser, Georg, Höche, ThomasVolume:
27
Journal:
Microscopy Today
DOI:
10.1017/s1551929519001020
Date:
November, 2019
File:
PDF, 3.98 MB
2019