[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream Cipher
Zeh, Alexander, Meier, Manuela, Rieger, ViolaYear:
2019
DOI:
10.1109/DFT.2019.8875478
File:
PDF, 245 KB
2019