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[IEEE 2019 IEEE 9th International Nanoelectronics Conferences (INEC) - Kuching, Malaysia (2019.7.3-2019.7.5)] 2019 IEEE 9th International Nanoelectronics Conferences (INEC) - Spatially Mapping Work Function Changes and Defect Evolution in the Fluorination of Graphene
Ong, Bin Leong, Ong, Sheau Wei, Liu, Bo, Lai, Chao Sung, Johll, Harman, Kang, Hway Chuan, Tok, Eng SoonYear:
2019
DOI:
10.1109/inec.2019.8853850
File:
PDF, 2.12 MB
2019