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In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy
Fernández, Sara, Jean, Cyril, Charron, Eric, Gentile, Pascal, Richard, Marie-Ingrid, Thomas, Olivier, Perrin, Bernard, Belliard, LaurentVolume:
126
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5122263
Date:
November, 2019
File:
PDF, 2.66 MB
english, 2019