[IEEE 2019 20th International Conference of Young...

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[IEEE 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2019.6.29-2019.7.3)] 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Statistical Approach of the Isoline Drift Compensating in the Systems of Bifunctional Biomedical Signals Monitoring

Markulyova, Marina V., Bezborodova, Oksana E., Gerashchenko, Mikhail S., Gerashchenko, Sergey I., Polosin, Vitaly G.
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Year:
2019
Language:
english
DOI:
10.1109/edm.2019.8823566
File:
PDF, 581 KB
english, 2019
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