![](/img/cover-not-exists.png)
[IEEE 2019 Chinese Control And Decision Conference (CCDC) - Nanchang, China (2019.6.3-2019.6.5)] 2019 Chinese Control And Decision Conference (CCDC) - Defect Detection of Pantograph Slider Based on Improved Faster R-CNN
Jiang, Siyang, Wei, Xiukun, Yang, ZimingYear:
2019
Language:
english
DOI:
10.1109/CCDC.2019.8832401
File:
PDF, 729 KB
english, 2019