[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A State Assignment Method to Improve Transition Fault Coverage for Controllers
Yoshimura, Masayoshi, Takeuchi, Yuki, Yamazaki, Hiroshi, Hosokawa, ToshinoriYear:
2019
DOI:
10.1109/DFT.2019.8875322
File:
PDF, 108 KB
2019