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Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model
Naeem, Muhammad Rashid, Lin, Tao, Naeem, Hamad, Ullah, Farhan, Saeed, SaqibVolume:
7
Year:
2019
Journal:
IEEE Access
DOI:
10.1109/access.2019.2950171
File:
PDF, 3.38 MB
2019