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[IEEE 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2019.6.29-2019.7.3)] 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Dual-Receiver Radiometric System for Near Field Measurements in Hyperspectral Mode
Ubaychin, Anton V.Year:
2019
DOI:
10.1109/edm.2019.8823213
File:
PDF, 689 KB
2019