[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - A New DEC/TED Code for Fast Correction of 2-Bit-Errors
Nordmann, Paul-Patrick, Goessel, MichaelYear:
2019
DOI:
10.1109/iolts.2019.8854404
File:
PDF, 141 KB
2019