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Characteristics of partial discharge induced by continuous X-ray exposure of void defects in insulator
Shin, Ji-Yong, Kim, Eun-Hee, Kim, Sung-Wook, Jo, Hyang-Eun, Jung, Jae-RyongVolume:
26
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2019.008052
Date:
October, 2019
File:
PDF, 1.13 MB
2019