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Special Issue on Reliability
Mahapatra, Souvik, Chen, Kevin J., Kaczer, Ben, Pancheri, Lucio, Rosenbaum, Elyse, Mouli, Chandra, Wong, Hei, Kerber, Andreas, Monzio Compagnoni, Christian, Koval, Randy, Meneghesso, Gaudenzio, SheridVolume:
66
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2019.2943987
Date:
November, 2019
File:
PDF, 4.36 MB
2019