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ROC and Loss Function Analysis in Sequential Testing
Arno M. M. Muijtjens, Scheltus J. Van Luijk, Cees P. M. Van Der VleutenVolume:
11
Language:
english
Pages:
13
DOI:
10.1007/s10459-004-6856-7
Date:
February, 2006
File:
PDF, 286 KB
english, 2006