An analytical method to determine the complex refractive...

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Applied Surface Science 2019 / 12

An analytical method to determine the complex refractive index of an ultra-thin film by ellipsometry

Gu, Honggang, Zhu, Simin, Song, Baokun, Fang, Mingsheng, Guo, Zhengfeng, Chen, Xiuguo, Zhang, Chuanwei, Jiang, Hao, Liu, Shiyuan
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2019.145091
Date:
December, 2019
File:
PDF, 1.07 MB
english, 2019
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