Rule-Based Design for Multiple Nodes Upset Tolerant Latch Architecture
Sajjade, Faisal Mustafa, Goyal, Neeraj Kumar, Varaprasad, B. K. S. V. L.Volume:
19
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2945917
Date:
December, 2019
File:
PDF, 2.31 MB
english, 2019