Imaging Atomically Thin Semiconductors Beneath Dielectrics via Deep Ultraviolet Photoemission Electron Microscopy
Berg, Morgann, Liu, Fangze, Smith, Sean, Copeland, R. Guild, Chan, Calvin K., Mohite, Aditya D., Beechem, Thomas E., Ohta, TaisukeVolume:
12
Language:
english
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.12.064064
Date:
December, 2019
File:
PDF, 1.94 MB
english, 2019