[IEEE 2019 3rd International Conference on Trends in...

  • Main
  • [IEEE 2019 3rd International Conference...

[IEEE 2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2019.4.23-2019.4.25)] 2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI) - A Novel Hazard Analysis and Risk Assessment for Automotive Embedded System Development as Safety Element Out of Context

Nag, Pramit, Harmalkar, Jyoti, Ghanekar, Umesh
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/icoei.2019.8862521
File:
PDF, 3.00 MB
english, 2019
Conversion to is in progress
Conversion to is failed