Functional tests of a 0.6

Analog Integrated Circuits and Signal Processing 2008 / 03 Vol. 54; Iss. 3

Functional tests of a 0.6

Laurent Gatet, Hélène Tap-Béteille, Marc Lescure, Daniel Roviras, Alain Mallet
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Volume:
54
Language:
english
Pages:
9
DOI:
10.1007/s10470-008-9133-5
Date:
March, 2008
File:
PDF, 950 KB
english, 2008
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