A test points selection method for analog fault dictionary...

Analog Integrated Circuits and Signal Processing 2010 / 05 Vol. 63; Iss. 2

A test points selection method for analog fault dictionary techniques

Chenglin Yang, Shulin Tian, Bing Long, Fang Chen
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Volume:
63
Language:
english
Pages:
9
DOI:
10.1007/s10470-009-9369-8
Date:
May, 2010
File:
PDF, 285 KB
english, 2010
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