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Improved reconfigurability and noise margins in threshold logic gates via back-gate biasing in DG-MOSFETs
Savas Kaya, Darwin T. Ting, Hesham F. A. HamedVolume:
68
Language:
english
Pages:
9
DOI:
10.1007/s10470-010-9587-0
Date:
July, 2011
File:
PDF, 646 KB
english, 2011