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Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films
Han, Fengbo, Zhao, Wenyuan, Bi, Ran, Tian, Feng, Li, Yadan, Zheng, Chuantao, Wang, YidingVolume:
13
Language:
english
Journal:
Materials
DOI:
10.3390/ma13010113
Date:
December, 2019
File:
PDF, 2.35 MB
english, 2019