Electromagnetic inverse profiling for plasma diagnostics in compact microwave-based ion sources
Torrisi, G., Mascali, D., Castro, G., Naselli, E., Donato, L. Di, Sorbello, G.Volume:
14
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/14/09/C09031
Date:
September, 2019
File:
PDF, 957 KB
2019