Resistive switching in a LaMnO 3 + δ /TiN memory cell investigated by operando hard X-ray photoelectron spectroscopy
Meunier, Benjamin, Martinez, Eugénie, Rodriguez-Lamas, Raquel, Pla, Dolors, Burriel, Mònica, Boudard, Michel, Jiménez, Carmen, Rueff, Jean-Pascal, Renault, OlivierVolume:
126
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5125420
Date:
December, 2019
File:
PDF, 2.22 MB
english, 2019