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[AIP Beam instrumentation - Argonne, Illinois (USA) (May 1996)] AIP Conference Proceedings - Low-intensity beam diagnostics with particle detectors
Rovelli, A., Ciavola, G., Cuttone, G., Finocchiaro, P., Raia, G., De Martinis, C., Giove, D.Volume:
390
Year:
1997
Language:
english
DOI:
10.1063/1.52296
File:
PDF, 754 KB
english, 1997