MIL-STD-781B Reliability Tests: Exponential Distribution

MIL-STD-781B Reliability Tests: Exponential Distribution

Neathammer, Robert D., Pabst, William R., Wigginton, Carl G.
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Volume:
7
Language:
english
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.1975.12002461
Date:
January, 1975
File:
PDF, 1.65 MB
english, 1975
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