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TCAD-Based Assessment of Dual-Gate MISHEMT with Sapphire, SiC, and Silicon Substrate
Singh, Preeti, Kumari, Vandana, Saxena, Manoj, Gupta, MridulaLanguage:
english
Journal:
IETE Technical Review
DOI:
10.1080/02564602.2019.1699455
Date:
December, 2019
File:
PDF, 1.91 MB
english, 2019