European Microscopy Congress 2016: Proceedings || In situ...

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European Microscopy Congress 2016: Proceedings || In situ electrical testing across nano-scale contact interfaces in the transmission electron microscope

Alsem, Daan Hein
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Year:
2016
DOI:
10.1002/9783527808465.emc2016.5702
File:
PDF, 350 KB
2016
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