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Bit Depth Expansion via Estimation of Bit Value Expectation
Woo, Jihwan, Lee, Seoyoung, Choe, WonheeVolume:
2016
Language:
english
Journal:
Electronic Imaging
DOI:
10.2352/ISSN.2470-1173.2016.14.IPMVA-383
Date:
February, 2016
File:
PDF, 1007 KB
english, 2016