[IEEE 2019 Joint International Symposium on Electromagnetic...

[IEEE 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) - Sapporo, Japan (2019.6.3-2019.6.7)] 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) - Establishment of ESD Generator Model for Transient Susceptibility Analysis from Chip to System Level

Lin, Han-Nien, Ko, Bo-Ning, Lin, Jeffrey Yen-Ting, Ho, Tzu-Hao, Lin, Min-Shang, Su, Chia-Hung

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Year:

2019

Language:

english

DOI:

10.23919/EMCTokyo.2019.8893786

File:

PDF, 1.21 MB

english, 2019

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