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Comparative Study of Optical and Electrical Properties of Grown-In and Freshly Introduced Dislocations in GaN by SEM Methods
Vergeles, P. S., Yakimov, E. B., Orlov, V. I.Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-019-07930-z
Date:
January, 2020
File:
PDF, 768 KB
english, 2020