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[AIP REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION:Volume 22 - Bellingham, Washington (USA) (14-19 July 2002)] AIP Conference Proceedings - Nano Spatial Resolution with 60 GHz Near-Field Scanning Millimeter-Wave Microscope
Kim, MyungsikVolume:
657
Year:
2003
DOI:
10.1063/1.1570170
File:
PDF, 648 KB
2003