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[IEEE IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium - Yokohama, Japan (2019.7.28-2019.8.2)] IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium - From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling
Denis, Loic, Deledalle, Charles-Alban, Tupin, FlorenceYear:
2019
Language:
english
DOI:
10.1109/IGARSS.2019.8898473
File:
PDF, 2.38 MB
english, 2019