Proton Irradiation Effects on the Time-Dependent Dielectric...

Micromachines 2019 / 10 Vol. 10; Iss. 11

Proton Irradiation Effects on the Time-Dependent Dielectric Breakdown Characteristics of Normally-Off AlGaN/GaN Gate-Recessed Metal-Insulator-Semiconductor Heterostructure Field Effect Transistors

Keum, Dongmin, Kim, Hyungtak
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Volume:
10
Journal:
Micromachines
DOI:
10.3390/mi10110723
Date:
October, 2019
File:
PDF, 2.83 MB
2019
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