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Electrical Performance and Bias-Stress Stability of Amorphous InGaZnO Thin-Film Transistors with Buried-Channel Layers
Zhang, Ying, Xie, Haiting, Dong, ChengyuanVolume:
10
Journal:
Micromachines
DOI:
10.3390/mi10110779
Date:
November, 2019
File:
PDF, 2.39 MB
2019