Modified Hurkx band-to-band-tunneling model for accurate...

Microelectronics Reliability 2020 / 01 Vol. 104

Modified Hurkx band-to-band-tunneling model for accurate and robust TCAD simulations

Wong, Hiu-Yung, Dolgos, Denis, Smith, Lee, Mickevicius, Rimvydas V.
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Volume:
104
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113552
Date:
January, 2020
File:
PDF, 1.21 MB
2020
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