Multilevel memory and synaptic characteristics of a-IGZO thin-film transistor with atomic layer–deposited Al 2 O 3 /ZnO/Al 2 O 3 stack layers
Liu, Dan-Dan, Pei, Junxiang, Li, Lingkai, Huo, Jingyong, Wu, Xiaohan, Liu, Wen-Jun, Ding, Shi-JinJournal:
Journal of Materials Research
DOI:
10.1557/jmr.2019.355
Date:
November, 2019
File:
PDF, 654 KB
2019