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X-ray diffraction and Raman characterization of β-Ga 2 O 3 single crystal grown by edge-defined film-fed growth method
Yao, Yongzhao, Ishikawa, Yukari, Sugawara, YoshihiroVolume:
126
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5129226
Date:
November, 2019
File:
PDF, 3.08 MB
2019