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[IEEE 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Beijing, China (2018.5.16-2018.5.18)] 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Studies of the Linear Block Codes for Memory Protection
Cao, Hui, Jin, Yu-LinYear:
2018
DOI:
10.1109/ICREED.2018.8905105
File:
PDF, 2.11 MB
2018