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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks || Image analysis
Krinsley, David H., Pye, Kenneth, Boggs, Jr, Sam, Tovey, N. KeithVolume:
10.1017/CB
Year:
1998
DOI:
10.1017/CBO9780511628894.010
File:
PDF, 6.45 MB
1998