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[IEEE 2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India) - Hyderabad, India (2019.2.25-2019.2.27)] 2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India) - Simulation, Characterization and Parameter Extraction of Radiation Hardened MOSFET
Kumar Verma, Jay Hind, Ghosh, Sudip, Yadav, Ashutosh, Chauhan, Yogesh SinghYear:
2019
DOI:
10.1109/MOS-AK.2019.8902358
File:
PDF, 2.64 MB
2019