High-resolution genetic mapping of a novel bacterial blight...

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Theoretical and Applied Genetics 2019 / 12

High-resolution genetic mapping of a novel bacterial blight resistance gene xa-45(t) identified from Oryza glaberrima and transferred to Oryza sativa

Neelam, Kumari, Mahajan, Ritu, Gupta, Vikas, Bhatia, Dharminder, Gill, Baljeet Kaur, Komal, Ratika, Lore, Jagjeet Singh, Mangat, Gurjit Singh, Singh, Kuldeep
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Journal:
Theoretical and Applied Genetics
DOI:
10.1007/s00122-019-03501-2
Date:
December, 2019
File:
PDF, 2.02 MB
2019
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