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Vacancy-modulated self-rectifying characteristics of NiOx/Al2O3-based nanoscale ReRAM devices
Lee, Ji Hwan, Park, Ju Hyun, Dongale, Tukaram D., Kim, Tae GeunJournal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2019.153247
Date:
December, 2019
File:
PDF, 1.99 MB
2019