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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Ichihara, Hideyuki, Maeda, Yuki, Iwagaki, Tsuyoshi, Inoue, TomooYear:
2019
DOI:
10.1109/DFT.2019.8875383
File:
PDF, 328 KB
2019