Multiple Layout-Hardening Comparation of SEU Mitigated...

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IEEE Transactions on Nuclear Science 2019

Multiple Layout-Hardening Comparation of SEU Mitigated Filp-Flops in 22 nm UTBB FD-SOI Technology

Cai, Chang, Chen, Gengsheng, Liu, Jie, Liu, Tianqi, Zhao, Peixiong, Fan, Xue, Huang, Hongyang, Li, Dongqing, Ke, Lingyun, He, Ze, Xu, LieWei
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Year:
2019
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2956171
File:
PDF, 1.01 MB
2019
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