[IEEE 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) - Cuzco, Peru (2019.10.6-2019.10.9)] 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) - Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs
Zimpeck, Alexandra L., Meinhardt, Cristina, Artola, Laurent, Hubert, Guillaume, Kastensmidt, Fernanda L., Reis, RicardoYear:
2019
DOI:
10.1109/VLSI-SoC.2019.8920383
File:
PDF, 102 KB
2019