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Fault-tolerant protection of near-term trapped-ion topological qubits under realistic noise sources
Bermudez, A., Xu, X., Gutiérrez, M., Benjamin, S. C., Müller, M.Volume:
100
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.100.062307
Date:
December, 2019
File:
PDF, 3.00 MB
2019